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微波器件射频动态老化系统研究

〖字号: 发布日期:2017-03-21

微波器件射频动态老化系统研究

迟 雷1,2,陈龙坡1,2,黄 杰1,2,彭 浩1,2
1. 中国电子科技集团公司第十三研究所,石家庄 050051;2. 国家半导体器件质量监督检验中心,石家庄 050051)
摘要:随着微波器件的发展应用领域的扩展,对其可靠性的要求也越来越高。在微波器件的可靠性评估试验中,射频动态老化试验是最重要的试验之一。而试验系统的可靠性,经济性和实用性直接影响到可靠性评估的安全性和准确性。本文选取微波混频器为研究对象,设计并搭建了射频动态老化系统,在设计中加入了负反馈电路以保证系统的稳定性。基于虚拟仪器软件和数据采集卡,上位计算机可实时采集海量状态信息,如直流参数和射频参数。通过微波器
关键字:微波器件;射频动态老化试验;负反馈电路;功率监测

Research on RF Dynamic Burn-in System for Microwave Devices

CHI Lei1,2,CHEN Long-po1,2, HUANG Jie1,2,PENG Hao1,2
(1.The 13th Research Institute, CETC, Shijiazhuang 050051;2. National Semiconductor Device Quality S
Abstract:Abstract:With the development of microwave devices and the expansion of applications, the higher reliability of microwave devices is required. RF dynamic burn-in test is the most important test in the reliability evaluation microwave devices. The reliability economics and usability of the burn-in test system directly affects the safety and accuracy of the evaluation of microwave devices. This paper chooses microwave mixers as the study object, and a kind of burn-in test system is designed and built.The design adds the negative feedback circuits to guarantee the stability of the system. Based on virtual instrument software and data acquisition card, the upper computer can measure process numerous real-time status messages, such as DC parameters and RF parameters. Some experiments and tests based on microwave devices show that the system can well complete the dynamic burn-in process. It is greatly improved and enhanced comparing with the traditional static system.
Key Words:microwave device; RF dynamic burn-in test; the negative feedback circuits; power monitoring


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